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Laboratories at Surfaces and thin films
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- Deposition of thin films
- Modification and coating of surfaces
- Corrosion measurements and protection
- Characterisation of structure, topography, chemical composition and optical properties
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Contact person:
Ragnar Fagerberg, phone: +47 93 05 93 09 More information on surfaces and thin films
Experimental techniques for surfaces and thin films
Characterisation- Field Emission Gun Transmission Electron Microscope (FEGTEM) with Energy Dispersive x-ray Spectroscopy (EDS), Electron Energy Loss Spectroscopy (EELS) and Energy Filtered Transmission Electron Microscopy (EFTEM)
- Field Emission Gun Scanning Electron Microscopy (FEGSEM), with Electron Backscattered Diffraction (EBSD)
- Low Vacuum Scanning Electron Microscopy (LVSEM)
- Atomic Force Microscope (AFM)
- Scanning Kelvin Probe AFM (SKP-AFM)
- Electron probe micro analyser (EPMA)
- X-ray Photoelectron Spectroscopy (XPS)
- Electrochemical Impedance Spectroscopy (EIS)
- Combination Scanning Vibrating/Kelvin Probe system (SVP/SKP)
- White Light Interferometry (WLI)
- Ellipsometry (UV-VIS-NIR)
- Spectroscopy
- Microscopy
- Light scattering, Total light reflection, Gloss, Colour
Thin film deposition- Computerised pulsed electrodeposition equipment (100A/30V)
- Pulsed Laser Deposition (PLD) - from summer 2005
- Close-Spaced Vapor Transport (CSVT) - from summer 2005
External facilities and collaborations- Synchrotron x-ray techniques
- Auger Electron Spectroscopy (AES) and Scanning Auger Microscopy (SAM)
- Glow Discharge Optical Emission Spectroscopy (GD-OES)
- Atom Probe Field Ion Microscopy (APFIM)
- Secondary Ion Mass Spectrometry (Dynamic SIMS and NanoSIMS)
- UV-NIR and IR reflectivity and absorption measurements
Published January 8, 2007
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